Structure and process for contacting and interconnecting semiconductor devices within an integrated circuit

ABSTRACT

An improved structure and process for contacting and interconnecting semiconductor devices within a VLSI integrated circuit are described. The structure includes several regions which cooperate to provide (1) contacts of low electrical resistance to semiconductor device terminals, (2) barriers to unwanted metallurgic reactions, (3) strong bonds between major regions of the structure, (4) overall mechanical strength, (5) a primary current path of low electrical resistance, (6) a secondary current path in parallel with the primary current path, and (7) circuit bond pads for use in making electrical connections to the VLSI circuit. Because of the structure&#39;s mechanical strength, semiconductor devices may be placed beneath circuit bond pads. The inventive process facilitates accurate control of the composition and thickness of each of the several regions within the material structure.

BACKGROUND OF THE INVENTION

This invention relates generally to integrated circuits and moreparticularly to a structure and process for contacting andinterconnecting semiconductor devices within an integrated circuit. Anintegrated circuit comprises an ensemble of semiconductor devices. Thesemiconductor devices are principally formed in a single-crystalsemiconductor wafer. A thin dielectric layer either grown on ordeposited on the wafer surface and regions of polycrystallinesemiconductor material deposited on the thin dielectric layer areintegral parts of many semiconductor devices. A relatively thickdielectric layer is deposited over the semiconductor devices, andcontact openings are etched through this dielectric layer to provideaccess to terminals of the semiconductor devices. The ensemble ofsemiconductor devices is interconnected (integrated) by a complexpattern of metal lines running on top of the thick dielectric layer. Thelines contact terminals of the semiconductor devices through theopenings in the dielectric layer. A protective coating is applied afterformation of the interconnect pattern. Openings are made through theprotective coating to provide access to square features of theinterconnect pattern called bond pads. Electrical connections to theintegrated circuit are made at the bond pads. A very-large-scaleintegrated (VLSI) circuit may contain over one million semiconductordevices, include several meters of interconnect line length, and havemore than one hundred bond pads placed around the circuit perimeter.

Today, most integrated circuits are manufactured using silicon wafers,and an aluminum alloy is almost always used to interconnect the siliconsemiconductor devices. A low concentration (typically, 1 percent) ofsilicon is incorporated in the aluminum alloy to prevent excessiveabsorption of silicon from terminal regions of the semiconductordevices. A low concentration (typically, 0.5 to 4 percent) of a metalsuch as copper is often incorporated in the aluminum alloy to improveits mechanical stability.

When the density of semiconductor devices in VLSI circuits became greatenough to require that interconnect line widths be decreased to lessthan about 2 micrometers, aluminum alloys of uniform composition becameinadequate as a material for the lines. At such narrow line widths,current densities in VLSI circuits can be in the range of 1 millionamperes per square centimeter. At current densities on the order of 1million amperes per square centimeter, the rate of electron interactionswith aluminum ions is sufficient to cause migration (electromigration)of aluminum in the direction of the electron flow. Electromigration ofaluminum causes integrated circuits to fail due to the formation ofvoids (open circuits) in the interconnect lines. See J. R. Black,"Physics of Electromigration", Proceedings of 12th Reliability PhysicsSymposium, pp 142-149, 1974 and J. G. J. Chern, W. G. Oldham, and N.Cheung, "Electromigration in Al/Si Contacts-Induced Open-CircuitFailures", IEEE Transactions on Electron Devices, Vol ED-33, pp1256-1262, 1986. Interactions between the electron stream and silicon atcontacts to semiconductor device terminals can also cause circuitfailures due to extraction of silicon from the terminals. See J. G. J.Chern, W. G. Oldham, and N. Cheung, "Contact-Electromigration-InducedLeakage Failure in Aluminum-Silicon to Silicon Contacts", IEEETransactions on Electron Devices, Vol. ED-32, pp 1341-1346, 1985.Because the thermal expansion coefficients of aluminum alloys andsilicon do not match, thermal cycles used in integrated circuitmanufacturing cause stresses which exceed the yield strength of narrowinterconnect lines. See P. A. Flinn, D. S. Gardner, and W. D. Nix,"Measurement and Interpretation of Stress in Aluminum-BasedMetallization as a Function of Thermal History", IEEE Transactions onElectron Devices, Vol. ED-34, pp 689-699, 1987. When the lines yield,circuits fail due to formation of aluminum voids. See J. W. McPhersonand C. F. Dunn, "A Model for Stress-Induced Metal Notching and Voidingin Very-Large-Scale Integrated Al-Si (1%) Metallization", Journal ofVacuum Science and Technology, Vol. B5, pp 1321-1325, 1987.

Structures of alternating layers of an aluminum alloy and a refractorymetal have been proposed as a material for narrow-width interconnectlines. See D. S. Gardner, T. L. Michalka, K. C. Saraswat, T. W. Barbee,J. P. McVitte, and J. D. Meindl, "Layered and Homogeneous Films ofAluminum and Aluminum/Silicon with Titanium and Tungsten for MultilevelInterconnects", IEEE Transactions on Electron Devices, Vol. ED-32, pp174-183, 1985. These layered material structures are able to sustainmuch higher current densities than aluminum alloys of uniformcomposition. These layered structures are also mechanically muchstronger than uniform alloys; therefore, the layered structures are ableto survive more severe thermal cycles than uniform alloys.

Although material structures comprised of aluminum alloy layers andrefractory metal layers offer improvements over uniform alloys, therefractory metal layers can cause severe problems. After initialformation of the structure, aluminum alloy layers and refractory metallayers react, and properties of the interconnect lines degrade as aconsequence of the metallurgic reactions. When semiconductor deviceterminals are contacted directly by lines made of these layeredmaterials, silicon is extracted from the device terminals to such anextent that circuits fail. See K. Hinode, N. Owada, T. Terada and S.Iwata, "Silicon Take-Up by Aluminum Layered with Refractory Metals",IEEE Transactions on Electron Devices, Vol ED-34, pp 700-705, 1987 andR. E. Jones and L. D. Smith, "Contact Spiking and ElectromigrationPassivation Cracking Observed for Titanium Layered AluminumMetallization", Proceeding of the IEEE VLSI Multilevel InterconnectConference, 1985. A barrier must, therefore, be interposed between theinterconnect line and the terminal of the semiconductor device toprevent silicon extraction if layered structures are used forinterconnect lines in VLSI circuits.

A metallurgic barrier can be produced by depositing titanium nitride(TiN) over the device terminals, but semiconductor devicecharacteristics may be degraded. TiN films can be formed by reactivesputtering of titanium in a nitrogen atmosphere, but the as-depositedfilms exhibit compressive stresses at sufficient levels to causecracking and peeling of the films during thermal cycles subsequent tofilm deposition. See I. Suni, M. Maenpaa, and M. A. Nicolet, "ThermalStability of Hafnium and Titanium Nitride Diffusion Barriers inMultilayer Contacts to Silicon", Journal of the Electrochemical Society,130 No. 5, pp 1215-1218, 1983. Incorporation of oxygen in the TiN can beused to reduce compressive stress in the films, but incorporation ofoxygen in sufficient concentrations to reduce stress results in asignificant increase in the electrical resistance of the TiN film. SeeS. S. Ang, "Titanium Nitride Films with High Oxygen Concentration",Journal of Electronic Materials, Vol. 17 No. 2, pp 95-100, 1988. Also,because a thin (10 to 20 Angstroms) layer of silicon oxide rapidly formson exposed silicon surfaces, it is unlikely that TiN films, especiallyTiN films which incorporate oxygen, can form reliable, low-resistancecontacts to silicon semiconductor terminals. The combined resistance ofthe TiN film and TiN-silicon interface is in series with a semiconductordevice terminal and will cause degradation in the characteristics of thesemiconductor device.

A two-step process has been described for forming low-resistanceelectrical contacts to semiconductor device terminals and metallurgicbarriers over the terminals. See P. J. Rosser and G. J. Tomkins, "SelfAligned Nitridation of TiSi₂ : A TiN/TiSi₂ Contact Structure," MaterialResearch Society Symposium Proceedings, 1985. Titanium is deposited onthe semiconductor wafer, preferably using a sputtering process. Thetitanium is reacted with silicon and nitrogen during first thermal cycleto form a rather thick layer of titanium disilicide within the surfaceregion of the semiconductor device terminals and a rather thin layer oftitanium oxynitride over the surface of the device terminals. Becauseimpurities tend to segregate into the oxynitride layer and becauseunreacted titanium may remain after the first thermal cycle, thetitanium oxynitride layer and any residual titanium are then removed byetching with a suitable chemical solution. A portion of the titaniumdisilicide (TiSi₂) is converted to titanium nitride (TiN) during asecond thermal cycle in a nitrogen atmosphere. The final structure atthe device terminals is a TiSi₂ layer to provide an electrical contactand an overlying TiN layer to provide a metallurgic barrier.

Although it produces a low-resistance electrical contact and ametallurgic barrier, the above-described process has inherentdisadvantages. During the first thermal cycle too much silicon isconsumed from the device terminals, because a rather thick layer ofTiSi₂ must be formed. Control of the TiSi₂ and TiN thicknesses is verydifficult, because reactions proceed rapidly at the temperature requiredto form TiSi₂ and the thicknesses are controlled by the duration of thethermal cycle. Finally, the above-described process is rather complexand difficult to apply in volume manufacturing.

A good metallurgic barrier and a low-resistance electrical contact canbe simultaneously formed. See E. H. Stevens, P. J. McClure and C. W.Hill, "Semiconductor Contact Process," U.S. patent Ser. No. 4,784,973.First, a very thin (10 to 20 Angstroms) control layer of silicon oxideor silicon oxynitride is grown over the silicon surfaces that areexposed at contact openings to terminals of semiconductor devices. Then,a layer of titanium (Ti) is deposited under high vacuum conditions.Next, the titanium is reacted with nitrogen or ammonia at a temperatureof 600 degrees to 700 degrees centigrade to simultaneously form a thin(0.05 to 0.1 micrometers) layer of titanium disilicide (TiSi₂) withinthe silicon and layer of TiN of 0.05 to 0.2 micrometers thickness overthe silicon. The control layer of silicon oxide or silicon oxynitrideallows the relative thicknesses of the TiN and TiSi₂ to be controlled.The control layer also supplies small amounts of oxygen and nitrogen forincorporation in the TiN film. The TiSi₂ layer forms a reliable,low-resistance electrical contact between silicon and TiN. The TiN layerwith trace amounts of oxygen and excess nitrogen incorporated in itsgrain boundaries provides a reliable metallurgic barrier which has anacceptable value for electrical resistance. These simultaneously-formedbarriers and contacts were improvements over previous approaches, andwere successfully used in conjunction with interconnect lines made ofaluminum alloys layered with refractory metals to manufacture VLSImemory circuits.

The method described above ca be used to simultaneously produce goodmetallurgic barriers and good electrical contacts between the barriersand silicon at semiconductor device terminals, but the method issomewhat difficult and expensive to apply in volume manufacturing ofVLSI circuits. Growth of very thin control layers with predictableproperties is difficult. Because the titanium layer must be depositedunder high vacuum conditions to prevent incorporation of too muchoxygen, expensive vacuum deposition equipment is required, and theinterior of the equipment must be kept extremely clean. During thereaction of titanium in a furnace to form the TiN and TiSi₂ layers,oxygen and other trace contaminants must be held to low concentrationlevels. Thus, furnace maintenance must be done thoroughly andfrequently.

Although simultaneously-formed TiN layers for metallurgic barriers andTiSi₂ layers for contacts between TiN and silicon allow the use oflayered material structures for VLSI circuit interconnect lines, thelayered material structure of the interconnect lines can still causereductions in VLSI circuit performance and reliability. To sufficientlyincrease the current-carrying capacity and mechanical strength of narrowinterconnect lines, thicknesses of the refractory metal layers must bein the range of 0.02 to 0.05 micrometers. During thermal cyclessubsequent to deposition of the layered material structure, therefractory metal layers react with aluminum to form compounds whichexhibit high electrical resistivities. Hence, resistances ofinterconnect lines made of layered structures can be significantlyhigher than resistances of lines made of uniform aluminum alloys. Theconsequence of increased interconnect line resistances is reduced VLSIcircuit performance. Aluminum can react with TiN and after sufficienttime the TiN barriers may develop imperfections. See M. Wittmer,"Interfacial Reactions Between Aluminum and Transition-Metal Nitride andCarbide Films", Journal of Applied Physics, Vol. 53, No. 2, pp1007-1012, 1982. Because aluminum-refractory metal compounds absorbsilicon to high concentrations silicon will be extracted from a terminalof a semiconductor device and absorbed in the intermetal compounds ifeven the slightest imperfection develops in a TiN barrier.

The coating applied over the integrated circuit cannot be expected toprovide both mechanical support for the interconnect pattern andprotection for the underlying circuit. At completion of circuitmanufacturing, the coating is often in a state of compressive stress;consequently, because it is in direct contact with the interconnectpattern, the coating transmits a tensile stress to the interconnectlines and weakens the lines. If special care is taken to form thecoating in a state of high tensile stress, the interconnect lines arestrengthened, but the high tensile stress can cause the coating to crackand as a consequence, fail to protect the integrated circuit.

If interconnect lines are made using a mechanically strong layeredmaterial structure and if the lines are additionally strengthened byapplying a protective coating in a state of moderate tensile stress,reliable VLSI circuits can be manufactured.

Electrical connections to integrated circuits ar made at bond pads whichare usually placed around the circuit chip perimeter. The most commonlyused means of establishing electrical connections is a thermocompressionbond between the bond pad and a small diameter gold or aluminum alloywire. Recently, there has been a trend to establish electricalconnections by soldering the chips to a conductor pattern on a suitablesubstrate or by attaching one end of metal alloy tabs to the integratedcircuit bond pads and subsequently attaching the other end of the tabsto a conductor pattern on a substrate. See P. Singer, "Multi-chipPackaging on Silicon Substrates," Semiconductor International, p 34,June, 1987, and R. Bowlby, "The DIP May Take its Final Bows," IEEESpecturm, pp 37-42, June, 1985.

In addition to having sufficient mechanical strength and low electricalresistance, the interconnect material structure must be compatible withthe means employed to make electrical contacts to the integratedcircuit. If thermocompression bonding of gold wires is employed, theuppermost layer of the material structure cannot be a refractory metalunless a layer of appropriate material is added over the bond pads. Ifeither soldering to conductor patterns on a substrate or attachment ofmetal tabs is employed, the uppermost layer of the interconnect materialstructure must either be a metallurgic barrier or a barrier layer mustbe added over the bond pads.

Bond pads occupy significant area on the surface of VLSI circuits.Severe deformations of the bond pad materials are produced during thethermocompression bonding of wires to the pads. In the prior art,semiconductor devices are not placed beneath bond pads in highreliability circuits, because the deformations produced during bondingcan be transmitted to the underlying devices and thereby damage thosedevices. If semiconductor devices could be placed beneath bond pads,areas and manufacturing costs of VLSI circuits would be reduced andperformances of VLSI circuits would be increased.

In view of the foregoing background it can be seen that there is a needin the art for an improved material structure for use in contacting andinterconnecting semiconductor devices within VLSI circuits and a processwhich is amenable to volume manufacturing for forming the improvedmaterial structure.

SUMMARY OF THE INVENTION

To overcome deficiencies in the prior art, a structure and process havebeen invented for contacting and interconnecting semiconductor deviceswithin an integrated circuit. The first broad aspect of this inventionis a multi-region material structure that is used to establish contactsto semiconductor device terminals and to form lines which establishelectrical connections among the semiconductor devices. Incorporatedwithin the material structure are regions that: (1) providelow-resistance electrical contacts between semiconductor deviceterminals and interconnect lines without damaging the semiconductor andinterconnect line materials; (2) provide a primary current-carrying pathof low electrical resistance; (3) provide a secondary current-carryingpath in parallel with the primary path to enhance the reliability ofinterconnect lines; (4) impede unwanted reactions between adjacentregions within the interconnect lines and also form strong bonds betweenthese adjacent regions; (5) greatly increase the mechanical strength ofinterconnect lines without significantly increasing the electricalresistance of the lines; (6) and provide a metallurgic barrier at theupper surface of the interconnect lines. As a result of the newstructure devised for interconnect lines, the reliability of VLSIcircuits manufactured using the new structure of the present inventionsurpasses that attainable in VLSI circuits constructed according to theprior art. Because the uppermost region of the interconnect structure isa metallurgic barrier, formation of electrical connections to theintegrated circuit at the bond pads is facilitated. Because themulti-region material structure of the present invention producescircuit bond pads which have exceptional mechanical strengthsemiconductor devices may be placed beneath those circuit bond pads witha resultant decrease in circuit area and consequent decrease inmanufacturing cost and increase in circuit performance. A second broadaspect of the present invention is a process for forming themulti-region material structure. The process is such that thicknessesand material properties of the various regions within the materialstructure can be accurately controlled. The process is amenable tovolume manufacturing of VLSI circuits because it can be controlled andbecause the conditions required during formation of the various materialregions can be readily attained using currently available manufacturingequipment.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a diagram illustrating a cross-sectional view of an integratedcircuit in accordance with the present invention that shows the materialstructure in the vicinity of a semiconductor device terminal.

FIG. 2 is a diagram illustrating a portion of the material structure ofFIG. 1 which exists at an intermediate step in the process of thepresent invention.

FIG. 3 is a diagram illustrating a portion of the material structure ofFIG. 1 which exists at a step in the process of the present inventionsubsequent to that shown in FIG. 2.

FIG. 4 is a diagram illustrating a portion of the material structure ofFIG. 1 which exists at a step in the process of the present inventionsubsequent to that shown in FIG. 3.

FIG. 5 is a diagram illustrating a cross-sectional view of an integratedcircuit having a more simplified material structure than that shown inFIG. 1.

FIG. 6 is a diagram illustrating a cross-section view of an integratedcircuit having region additional to the material structure shown in FIG.1 to facilitate making electrical connections at the circuit bond padsof the integrated circuit.

DETAILED DESCRIPTION OF THE INVENTION

The structure and process of the present invention may be understoodwith reference to the six appended drawing figures. Referring now toFIG. 1, there is shown a representative cross-sectional view of variousmaterial regions within a VLSI circuit that includes a region 1comprising a semiconductor wafer. The preferred semiconductor for themanufacture of VLSI circuits is silicon. Region 2 comprises a dielectriclayer which is either grown on or deposited on the surface ofsemiconductor wafer region 1. Preferred materials for region 2 aresilicon oxide, silicon oxynitride, and silicon nitride. Thickness forregion 2 typically range from 0.2 to 2.0 micrometers. Region 3represents a contact opening etched through region 2 by appropriatechemical means to provide access to the surface of semiconductor waferregion 1 at a terminal of a semiconductor device. The walls which boundregion 3 should be sloped as shown to permit good coverage of depositedmaterials on the walls and on the surface of semiconductor waferregion 1. Region 4 comprises a metal silicide, whose primary function isto provide a low resistance electrical contact between regions 1 and 6.Several regions comprise compounds which have a refractory metal as aconstituent. A deposited refractory metal, such as titanium, tantalum,molybdenum, vanadium or tungsten reacts with semiconductor wafer region1 to form metal silicide region 4, reacts with dielectric layer region 2to form region 5, and is converted to a metal oxynitride comprisingregion 6 during an elevated temperature cycle. In forming metal silicideregion 4 and metal oxynitride region 6, thin films of silicon oxide orcontaminants which might have existed just above the surface ofsemiconductor wafer region 1, contaminants which might have existed justbeneath the surface of semiconductor wafer region 1, and a portion ofthe deposited refractory metal are incorporated in region 6. Smallconcentrations of some contaminants and a portion of the depositedrefractory metal are incorporated in region 4. Structural flaws whichmight have existed just beneath the surface of the semiconductor waferregion 1 are removed by material movements which occur in formingregions 4 and 6 during the elevated temperature cycle. Preferredthicknesses for metal silicide region 4 range from 0.01 to 0.1micrometers. Region 5 is a material bonding layer formed by reactionbetween the refractory metal and dielectric region 2. Preferredthicknesses for the material bonding region 5 range from 0.002 to 0.01micrometers. Preferred thicknesses for metal oxynitride region 6 rangefrom 0.01 to 0.1 micrometers. The preferred refractory metal istitanium, and the preferred silicide is titanium disilicide (TiSi₂).Metal oxynitride region 6 is the first layer in a composite metallurgicbarrier. In metal oxynitride region 6, current flow is required onlythrough the thin layer interposed between metal silicide region 4 andregion 7. Thus, the barrier properties of metal oxynitride region 6 maybe optimized without much concern about maintaining a low electricalresistivity for this region. The preferred composition for metaloxynitride region 6 is of the form Metal-O_(x) -N_(y), with x-values inthe range of 0.05 to 0.2 and corresponding y-values in the range of 0.95to 0.8. Region 7 is the second layer of the composite metallurgicbarrier. In accordance with the present invention, region 7 not onlyserves as a metallurgic barrier but also a current-carrying path aroundsmall voids which might form in region 9 after thermal cycles. Currentbetween metal silicide region 4 and region 9 also flows through region7. Because it provides a current path in parallel to region 9, region 7must have relatively low electrical resistivity. Because its resistivityis on the order of 50 micro-ohm-centimeters and because of its goodproperties as a metallurgic barrier, low oxygen content titanium nitrideis the preferred material for region 7. Preferred thicknesses for region7 are in the range of 0.05 to 0.2 micrometers. Region 8 is formed bydepositing a layer of titanium and subsequently reacting the titaniumwith materials from regions 7 and 9 during an elevated temperaturecycle. Region 8 comprises silicon dissolved to the saturationconcentration in an aluminum-titanium compound. Region 8 may alsocontain oxygen and nitrogen. The silicon dissolved in region 8 isextracted from region 9. Preferred thicknesses for region 8 range from0.005 to 0.02 micrometers. Region 8 forms a strong bond between regions7 and 9. Region 8 also serves as a barrier to impede unwanted reactionsbetween regions 7 and 9. Region 9 is an aluminum alloy. The preferredalloy incorporates silicon in concentrations ranging from 0.1 to 1.0percent and titanium in concentrations ranging from 0.1 to 2.0 percent.The preferred thickness of region 9 ranges from 0.3 to 1.0 micrometers.Silicon from region 9 is consumed in the formation of regions 8 and 10.Silicon, titanium and aluminum form compounds which precipitate in thegrain boundaries of region 9. Region 10 is of the same composition asregion 8, is formed in the same manner as region 8, and like region 8,forms a bond between and impedes unwanted reactions between the tworegions 9 and 11 which it joins. Region 11 is a deposited layer oftitanium oxynitride (TiO_(x) N_(y)) with x-values between 0.1 and 0.3and corresponding y-values between 0.9 and 0.7. The primary functions ofregion 11 are to add mechanical strength to the multi-region materialstructure, and, in some applications, to provide a top-side metallurgicbarrier. To help hold the underlying aluminum alloy layer region 9together, it is preferred that region 11 be in a state of tensilestress. Tensile stress can be established in region 11 by depositingtitanium oxynitride of an appropriate composition. Preferred thicknessesof region 11 range from 0.05 to 0.5 micrometers.

The process employed to produce the structure hereinabove described mayno be understood with reference to FIGS. 2-4. A contact opening throughthe dielectric region 2 to to the surface of semiconductor wafer region1 is shown in FIG. 2. The opening may be formed with sloped walls by asuitable combination of plasma and wet chemical etching processes. Theopening after deposition of refractory metal region 6' and titaniumnitride region 7 is illustrated in FIG. 3. To allow optimization of thebarrier properties of the subsequently-formed region 6, oxygen andnitrogen may be incorporated in region 6' during its deposition. Thematerial structure of FIG. 3 is converted to the structure of FIG. 4 bya thermally activated reaction in an ammonia (NH₃) atmosphere. Duringthe reaction, region 5 is formed by reduction of the surface ofdielectric region 2, metal silicide region 4 is formed by reaction ofthe refractory metal with the semiconductor wafer region 1, and theportion of region 6' that is not consumed in forming regions 4 and 5 isconverted to the metal oxynitride region 6. Also during the reactionwith ammonia, excess nitrogen is incorporated in the grain boundaries ofregions 6 and 7 and stresses in regions 6 and 7 are somewhat relieved.Stress relief may occur through grain regrowth and material movementalong the interface between regions 6 and 7. Region 4 and the portion ofregion 6 that lies above region 4 are formed in reactions which competefor consumption of the refractory metal. Therefore, the thickness ofregion 4 can be controlled through appropriate choices of reactiontemperature and the deposited thicknesses of regions 6' and 7. Thepreferred thermal reaction cycle is performed in a rapid thermalprocessing machine with heat supplied by high-intensity infrared lamps.The temperature in the preferred cycle may range from 550 degrees to 900degrees centigrade. The duration of the preferred cycle may range from0.5 to 5.0 minutes. After the thermal treatment in ammonia, thesemiconductor wafer is returned to a vacuum deposition machine fordeposition of the layers which form the regions 8, 9, 10, and 11illustrated in FIG. 1. After all vacuum depositions have been completed,a thermal anneal is performed in a hydrogen-nitrogen atmosphere at atemperature ranging between 400 degrees and 450 degrees centigrade for aduration of 10 to 60 minutes. The reactions which produce the finalcompositions of the multi-region material structure occur during thispost-deposition anneal cycle.

Referring again to FIG. 1, the structure and process of this inventionproduce a metallurgic barrier between the semiconductor wafer and theinterconnect lines which is a significant improvement over the priorart. Because the structure is a composite of regions 6 and 7, theprocess used in forming metal-oxynitride region 6 may be adjusted suchthat the barrier properties of this region are optimized. The processused in forming region 7 may be adjusted to yield the best barrierproperties that are consistent with maintaining an electricalresistivity of less than 50 to 60 micro-ohm-centimeters for region 7.Low-oxygen-content titanium nitride meets the resistivity requirementfor region 7, and it also has good properties as a metallurgic barrier.The ammonia atmosphere used in the present invention for simultaneouslyforming regions 4, 5, and 6 and annealing region 7 allows relief of thehigh compressive stress levels that are usual in low-oxygen-contenttitanium nitride films. During the heat treatment in ammonia, smallcracks and other structural defects, which might be introduced inregions 6 and 7 during film deposition or during stress relief, have achance to regrow and heal. Finally, because the metallurgic barrier ofthe present invention is comprised of two regions which undergodifferent processing sequences, it is unlikely that contaminant-inducedstructural flaws will simultaneously pierce both regions and causebarrier failures. In the prior art, high compressive stresses andstructural flaws have caused failures in metallurgic barriers oftitanium nitride.

Referring again to FIG. 1 the structure and process of this inventionproduce interconnect lines which are superior to the prior art in termsof reliability and electrical properties. The interconnect lines in thisinvention are strengthened by regions 7 and 11, which interact onlyweakly, if at all, with the primary current-carrying layer, region 9.Furthermore regions 8 and 10 are included in this invention to impedeunwanted interactions between regions of the material structure. In theprior art, interconnect lines are strengthened by regions of arefractory metal, and the refractory metal regions interact verystrongly with the primary current-carrying regions to producesignificant and undesirable increases in electrical resistances ofinterconnect lines. Because region 11 can be formed in a state oftensile stress, the underlying layers of the interconnect structure canbe strengthened. The tensile stress in region 11 transmits a compressivestress to the underlying regions and thereby acts to eliminate orgreatly reduce the number of cracks and voids which form in region 9during temperature cycling of the interconnect structure. The higherconductivity region 7 of the interconnect-to-contact barrier acts as aredundant current-carrying path in parallel with the primary currentpath through region 9. Because titanium nitride is mechanically strong,it is unlikely that cracks, voids and other structural flaws which mightform in region 9 will coincide with a fracture in region 7. Thus, theredundancy provided by region 7 in parallel with region 9 will greatlyenhance the reliability of interconnect lines that are made in thestructure of the present invention Even when layered structures are usedin accordance with the prior art, the effectiveness of parallel-pathredundancy is reduced because the refractory metal and aluminum layersof the prior ar intermix.

Referring again to FIGS. 3 and 4, the process used in this invention forforming the interconnect-to-contact barrier permits better control ofthe thicknesses of the metal-silicide contact region 4 and themetallurgic barrier region 6 than can be achieved using the prior art.The reaction rate for forming region 4 has a different temperaturedependence than the reaction rate for forming region 6. Thus therelative thicknesses of regions 4 and 6 are influenced by the reactiontemperature. Because the nitrogen consumed in converting material fromregion 6' to region 6 is supplied from ammonia gas present in thereaction chamber atmosphere the rate of formation of region 6 isinfluenced by the composition of the gas mixture used as the reactonchamber atmosphere. Because the nitrogen consumed in forming region 6must be supplied by diffusion of nitrogen or ammonia through region 7,the rate of formation of region 6, is influenced by the thickness ofregion 7. After the deposited refractory metal, region 6' in FIG. 3, hasbeen consumed, the surface of region 4 proceeds to convert to a metalnitride, and thereby, the thickness of region 4 proceeds to decreasewhile the thickness of region 6 proceeds to increase. The presence ofregion 7 during the formation of regions 4 and 6 provides a means inaddition fixing the duration and temperature of the reaction cycle forcontrolling the relative thicknesses of regions 4 and 6. In addition,the presence of region 7 reduces the rate with which region 4 isconverted to region 6 after region 6' has been consumed. Thus, theprocess of this invention is much less sensitive to reaction cycleduration than processes of the prior art. In summary, the process ofthis invention permits accurate control of the thicknesses of regions 4and 6 by choosing appropriate values for the deposited thickness ofregion 6', the deposited thickness of region 7, the composition of thegas mixture in the reaction chamber, the reaction temperature, and theduration of the elevated temperature reaction cycle.

Referring to FIG. 3, the process of this invention is more amenable tovolume manufacturing than the best process available in the prior art.Growth of very thin control layers of known composition is not required.Oxygen is incorporated in region 6' by choice. Thus, vacuum depositionunder extremely low oxygen partial pressure is not required. In thisinvention, region 7 is formed by reactive sputtering of titanium in anitrogen-containing plasma to form titanium nitride (TiN). Because thealready-formed TiN is much less reactive than Ti and because TiN is adiffusion barrier to most contaminants, the process of the presentinvention for forming regions 4, 5, 6 and 7 is not as sensitive to traceamounts of contaminant gases as the processes available in the priorart.

The cross section fo a simplified structure is illustrated in FIG. 5.Compared to FIG. 1, the structure of FIG. 5 does not include regions 10and 11. For manufacturing processes in which the wafer is exposed toonly relatively low temperatures of less than 200 degrees to 400 degreescentigrade after interconnect forming and patterning, the simplifiedmaterial structure shown in FIG. 5 may be sufficient.

A cross section of the material structure in the vicinity of anintegrated circuit bond pad is shown in FIG. 6. Illustrated, in additionto the regions of FIG. 1, are the protective coating region 12, the bondpad opening region 13, a region 14 added to facilitate making electricalconnections to the circuit bond pads, and a region 15 occupied bysemiconductor devices within the semiconductor wafer region 1. Preferredmaterials for region 12 are silicon oxide, silicon oxynitride, siliconnitride, polyamides, or composite layers of two or more of thesematerials. Preferred thicknesses for region 12 range from 1.0 to 2.0micrometers. Region 13 is a bond pad opening etched through region 12 byappropriate chemical means. Depending on whether thermocompression wirebonds, solder bumps or metal alloy tabs are used to make electricalconnections to the integrated circuit, the preferred material for region14 may be either an aluminum alloy, a gold alloy, or a compositestructure of several metal layers. Thicknesses of region 14 may rangefrom 1.0 to several micrometers. The semiconductor devices in region 15ar comprised of the typical semiconductor regions used to form thesesemiconductor devices.

Referring again to FIG. 6, region 14, which often contains gold, isrequired in several of the methods now being use to make electricalcontacts to VLSI circuits. In the present invention, region 14 may beformed directly on the interconnect structure because of the goodmetallurgic barrier properties of region 11. In the prior art, ametallurgic barrier must be formed over the interconnect structure atbond pad openings before region 14 can be formed, because region 14would otherwise react very strongly with the interconnect materialstructures of the prior art.

Referring again to FIG. 6, a region 15 containing semiconductor devicesmay be located beneath bond pads in the present invention. Because theinterconnect structure of the present invention incorporates themechanically strong regions 7 and 11, the structure can withstandthermocompression bonding without transmitting deformation-induceddamage to the underlying devices in region 15. In the prior art, theinterconnect structure is not strong enough to allow the location ofsemiconductor devices under the bond pads of high-reliability VLSIcircuits. Compared to a circuit layout in the prior art without devicesbeneath the bond pads, a layout with devices beneath the bond pads willresult in a smaller circuit area and a proportionately lowermanufacturing cost per circuit. In addition, a smaller circuit area willresult in a higher circuit performance, because signal path lengths willon average be shorter.

I claim:
 1. A multi-region material structure for contacting andinterconnecting semiconductor devices within a VLSI circuit, thematerial structure comprising:a semiconductor wafer; a first dielectricregion overlying the semiconductor wafer, said first dielectric regionincluding openings therein for permitting electrical contact toterminals of the semiconductor devices; a low-resistance contact regionin the semiconductor wafer underlying the openings in said firstdielectric region; a first metallurgic barrier region overlying thefirst dielectric region and the low-resistance contact region, saidfirst metallurgic barrier region comprising a compound of a refractorymetal, oxygen, and nitrogen; a first material bonding region sandwichedbetween said first metallurgic barrier region and said first dielectricregion; a metallurgic barrier and current carrying region overlying saidfirst metallurgic barrier region, said metallurgic barrier and currentcarrying region comprising a compound of a refractory metal, oxygen, andnitrogen that is different from the compound comprising said firstmetallurgic barrier region, said metallurgic barrier and currentcarrying region having a resistivity of less than 60micro-ohm-centimeters; a primary current carrying path region overlyingsaid metallurgic barrier and current carrying region, for providing, incombination with said metallurgic barrier and current carrying region, acomposite path for carrying current between interconnected semiconductordevices; and a second material bonding region sandwiched between saidmetallurgic barrier and current carrying region and said primary currentcarrying path region.
 2. A multi-region material structure forcontacting and interconnecting semiconductor devices within a VLSIcircuit as in claim 1, further comprising:a second metallurgic barrierregion overlying said primary current carrying path region for providingadditional mechanical strength to said material structure; and a thirdmaterial bonding region sandwiched between said second metallurgicbarrier region and said primary current carrying path region.
 3. Amulti-region material structure for contacting and interconnectingsemiconductor devices within a VLSI circuit as in claim 2, furthercomprising:a second dielectric region overlying said second metallurgicbarrier region, said second dielectric region including openings thereinfor permitting electrical contact to VLSI circuit bond pads; and anelectrical connection region overlying said second dielectric region anddirectly interfacing with said second metallurgic barrier region at theopenings in said second dielectric region.
 4. A multi-region materialstructure for contacting and interconnecting semiconductor deviceswithin a VLSI circuit as in claim 1 wherein said refractory metalforming the compound of said first metallurgic barrier region comprisestantalum and wherein said refractory metal forming the compound of saidmetallurgic barrier and current carrying region comprises titanium.
 5. Amulti-region material structure for contacting and interconnectingsemiconductor devices within a VLSI circuit as in claim 1 wherein saidrefractory metal forming the compound of said first metallurgic barrierregion comprises molybdenum and wherein said refractory metal formingthe compound of said metallurgic barrier and current carrying regioncomprises titanium.
 6. A multi-region material structure for contactingand interconnecting semiconductor devices within a VLSI circuit as inclaim 1 wherein said refractory metal forming the compound of said firstmetallurgic barrier region comprises vanadium and wherein saidrefractory metal forming the compound of said metallurgic barrier andcurrent carrying region comprises titanium.
 7. A multi-region materialstructure for contacting and interconnecting semiconductor deviceswithin a VLSI circuit as in claim 1 wherein said refractory metalforming the compound of said first metallurgic barrier region comprisestungsten and wherein said refractory metal forming the compound of saidmetallurgic barrier and current carrying region comprises titanium.
 8. Amulti-region material structure for contacting and interconnectingsemiconductor devices within a VLSI circuit as in claim 1 wherein saidsecond material bonding region comprises a compound of aluminum,titanium, and silicon.
 9. A multi-region material structure forcontacting and interconnecting semiconductor devices within a VLSIcircuit as in claim 1 wherein said second material bonding regioncomprises a compound of aluminum, titanium, silicon, and nitrogen.
 10. Amulti-region material structure for contacting and interconnectingsemiconductor devices within a VLSI circuit as in claim 1 wherein saidsecond material bonding region comprises a compound of aluminum,titanium, silicon, nitrogen, and oxygen.
 11. A multi-region materialstructure for contacting and interconnecting semiconductor deviceswithin a VLSI circuit as in claim 1 wherein said primary currentcarrying path region is an alloy comprising aluminum, titanium, andsilicon.
 12. A multi-region material structure for contacting andinterconnecting semiconductor devices within a VLSI circuit as in claim2 wherein said third material bonding region comprises a compound ofaluminum, titanium, and silicon.
 13. A multi-region material structurefor contacting and interconnecting semiconductor devices within a VLSIcircuit as in claim 2 wherein said third material bonding regioncomprises a compound of aluminum, titanium, silicon, and nitrogen.
 14. Amulti-region material structure for contacting and interconnectingsemiconductor devices within a VLSI circuit as in claim 2 wherein saidthird material bonding region comprises a compound of aluminum,titanium, silicon, nitrogen, and oxygen.
 15. A multi-region materialstructure for contacting and interconnecting semiconductor deviceswithin a VLSI circuit as in claim 2 wherein said second metallurgicbarrier region comprises a compound of titanium, nitrogen, and oxygen.16. A multi-region material structure for contacting and interconnectingsemiconductor devices within a VLSI circuit as in claim 2 wherein saidsecond metallurgic barrier region comprises titanium oxynitride havingan oxygen to nitrogen ratio within the range of 0.1 to 0.4.
 17. Amulti-region material structure for contacting and interconnectingsemiconductor devices within a VLSI circuit as in claim 2 wherein saidsecond metallurgic barrier region exists in a state of tensile stress.18. A multi-region material structure for contacting and interconnectingsemiconductor devices within a VLSI circuit as in claim 2 wherein saidsecond metallurgic barrier region has a thickness of between 0.05 and0.5 micrometers.